Adhesion of polyimide to fluorine-contaminated Si0₂ surface. Effect of aminopropyltriethoxysilane on the adhesion

Abstract

The adhesion of pyromellitic dianhydride-oxydianiline (PMDA-ODA) polyimide to fluorine-contaminated silicon dioxide (F-Si02) with y-aminopropyltriethoxysilane (APS) adhesion promoter has been studied as a function of the peel ambient humidity. The peel strength was not affected by the change in peel ambient relative humidity (RH) from 11–17% to 35–60% when APS was used at the interface. Without APS, the adhesion degraded significantly with this change in RH. It was found that although the dip application of APS caused the removal of about 80% of the initial atomic percentage of fluorine on the surface, it could not be totally removed even after several days in water at elevated temperature. © 1991, Vsp. All rights reserved.