Advances in synchrotron X-ray polycrystalline diffraction

Abstract

The advantages of synchrotron radiation for X-ray polycrystalline diffraction are illustrated by a number of examples. The plane wave parallel-beam X-ray optics uses Si(111) channel monochromator for easy wavelength selection and a set of long parallel slits to define the diffracted beam. The constant simple instrument function and the high resolution symmetrical profiles (FWHM 0.05°) greatly simplify the data analysis and add a new dimension to profile broadening studies. The geometry permits uncoupling the θ-2θ sample-detector relationship without changing the profile shape and makes possible new applications such as grazing angle incidence depth analysis of thin films. The same instrumentation is used for high resolution energy dispersive diffraction (EDD) by step-scanning the monochromator.