PublicationJournal of Vacuum Science and Technology A: Vacuum, Surfaces and FilmsPaperCharacterization of epitaxial thin films by x-ray diffractionJournal of Vacuum Science and Technology A: Vacuum, Surfaces and FilmsView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Jan 1991PublicationJournal of Vacuum Science and Technology A: Vacuum, Surfaces and FilmsAuthorsArmin SegmullerIBM-affiliated at time of publicationTopicsPhysical SciencesMaterials DiscoveryShare
