PublicationPhysical Review LettersPaperComment on "synchrotron X-Ray Diffraction Study of Si during Pulsed-Laser Annealing"Physical Review LettersView publicationAbstractNo abstract available.Home↳ PublicationsDate13 Dec 1982PublicationPhysical Review LettersAuthorsJames A. Van VechtenIBM-affiliated at time of publicationShare