Computer simulation and analysis of high‐resolution electron microscope images and diffraction patterns with partial coherence, hollow cone illumination, and virtual apertures

Abstract

A general method for computing high‐resolution conventional transmission electron microscope images and diffraction patterns, when there are different types of partially coherent illumination conditions, is described. Examples of convergent beam, hollow cone, and virtual aperture illumination conditions are given in the context of interpreting image features. A comparison of real and computed diffraction patterns shows that, in practice, many innovative imaging modes are possible, which can be verified prior to real microscope experiments. Copyright © 1984 Wiley‐Liss, Inc.