Skip to main content
Research
Focus areas
Blog
Publications
Careers
About
Back
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Back
About
Overview
Labs
People
Back
Semiconductors
Back
Artificial Intelligence
Back
Quantum Computing
Back
Hybrid Cloud
Back
Overview
Back
Labs
Back
People
Research
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Blog
Publications
Careers
About
Overview
Labs
People
Open IBM search field
Close
Microscopy and Microanalysis
Paper
27 Aug 2014
Corrosion of metal films observed using in situ and Ex situ electron microscopy
Download paper
Abstract
No abstract available.
Related
Paper
Strain and stability of ultrathin Ge layers in Si/Ge/Si axial heterojunction nanowires
Paper
Au transport in catalyst coarsening and Si nanowire formation
Paper
Advances in situ ultra-high vacuum electron microscopy: Growth of SiGe on Si
Paper
Nanoscale chemical templating of Si nanowires seeded with Al
View all publications
