PublicationIEEE Transactions on Electron DevicesPaperData Storage in NOS: Lifetime and Carrier-to-Noise MeasurementsIEEE Transactions on Electron DevicesView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Jan 1995PublicationIEEE Transactions on Electron DevicesAuthorsBruce D. TerrisRobert C. BarrettIBM-affiliated at time of publicationShare
