Direct observation of anelastic bond-orientational anisotropy in amorphous Tb26Fe62Co12 thin films by x-ray diffraction

Abstract

We have measured the scattering intensity of amorphous Tb26Fe62Co12 thin films using synchrotron radiation with the scattering vector Q both in and out of the plane of the film. The anisotropy in the position of the first and second peaks of the scattering intensity indicates the presence of bond-orientational anisotropy, which we propose to be the principal origin of the magnetic anisotropy in these films. © 1991 The American Physical Society.