PublicationIEE/LEOS Summer Topical Meetings 1991Conference paperEffect of line resistance on picosecond optoelectronic probes and device characterizationIEE/LEOS Summer Topical Meetings 1991View publicationAbstractNo abstract availableHome↳ PublicationsDate24 Jul 1991PublicationIEE/LEOS Summer Topical Meetings 1991AuthorsM. ScheuermannIBM-affiliated at time of publicationShare