Effect of noise on timing or data-pattern dependent delay variation when transmission-line effects are taken into account for on-chip wiring

Abstract

The impact of data-pattern variation on timing for on-chip interconnect timing is investigated for typical local, global, and clock wiring. The validity of the methodology to combine noise and timing engines is benchmarked against accurate non-linear simulations with R(f)L(f)C circuit representation and recommendations for CAD tool development are given.