Electronic noise in Ba₂YCu₃O₇ films at high temperatures: A possible connection to stress relaxation

Abstract

We observe two types of electronic noise in Ba2YCu3O7 at high temperature. One type is likely due to temperature and pressure fluctuations in the environment of the sample. Because of the known sensitivity of Ba2YCu3O7 resistance to both temperature and pressure, this mechanism translates into 10 to 100 nV per root Hz of noise at temperatures above 750 K. The second type is more intrinsic, and may be related to stress relaxation in the film induced by the structural changes associated with the orthorhombic-tetragonal transition near 950 K. © 1989 IEEE