Conference paper

01 Dec 2007

High performance CMOS variability in the 65nm regime and beyond

View publication

Abstract

No abstract available.

Related

Conference paper

Topological semimetals for scaled back-end-of-line interconnect beyond Cu

Conference paper

PAIRS AutoGeo: An Automated Machine Learning Framework for Massive Geospatial Data

Conference paper

Carrier-Resolved Photo-Hall Effect: Unlocking a 140-year-old secret in Hall effect

Talk

Monitoring economic activity using satellite imagery and tracking COVID-19 epidemics impact on air quality

View all publications