Skip to main content
Research
Focus areas
Blog
Publications
Careers
About
Back
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Back
About
Overview
Labs
People
Back
Semiconductors
Back
Artificial Intelligence
Back
Quantum Computing
Back
Hybrid Cloud
Back
Overview
Back
Labs
Back
People
Research
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Blog
Publications
Careers
About
Overview
Labs
People
Open IBM search field
Close
IEEE T-ED
Paper
01 Jan 1982
IIA-1 Generalized Scaling Theory and its Application to a 1/4 Micron Mosfet Design
View publication
Abstract
No abstract available.
Related
Conference paper
Flexible test mode design for DRAM characterization
Paper
Recent advances in device simulation using standard transport models
Paper
Spreading Resistance in Submicron MOSFET's
Conference paper
Technologies to further reduce soft error susceptibility in SOI
View all publications
