Invited paper: Yin and Yang of embedded sensors for post-scaling-era

Abstract

As gains in integrated circuit power and performance achieved through scaling of feature sizes slows, system and circuit design must carry more of the burden for improvement. Aggressive design decreases guardbands, increasing the risk of circuit failure. This paper discusses the increasing need for embedded on-chip sensors to enable aggressive design and also to help counter the attendant increased risks. © 2011 IEEE.