Measuring the Delay of Sub-Nanosecond Circuits

Abstract

Sources of error in present methods of measuring circuit delay are described, along with a new technique which is particularly well suited to sub-nanosecond measurements. This technique measures the insertion delay of the circuit in a transmission system, has a time resolution of less than 10 picsecoods, and is directly calibrated in terms of length and the speed of light. © 1967, IEEE. All rights reserved.