Reflectivity, rotation, and ellipticity of magnetooptic film structures

Abstract

A general relation is derived between the incident, reflected, and transmitted waves for a multilayer structure containing one or more layers characterized by a magnetooptic dielectric tensor. The method consists of formulating the characteristic matrix for each layer and evaluating the matrix products numerically. From the resulting matrix, desired quantities such as reflectivity, transmission, rotation, and ellipticity are obtained. © 1984 Optical Society of America.