SEMM-2: A new generation of single-event-effect modeling tools

Abstract

The IBM soft-error Monte Carlo model SEMM-2 is a new general-purpose simulation platform developed for single-event-effect (SEE) analysis of advanced CMOS (complementary metaloxide semiconductor) technologies. The current status and major features of this system are presented in this paper, including the physics model modules for the relevant atomic and nuclear processes, the construction and application of databases, and the simulation methodologies used to solve general transport problems. SEE analysis can be carried out for a large class of radiation subatomic particles in arbitrarily complex geometries and material composition of the integrated circuit designs. © Copyright 2008 by International Business Machines Corporation.