The reliability of approximate testabilty measures

Abstract

There are several techniques for gauging the accuracy of approximate testability measures. The measures described here estimate the random-pattern testability of gate-level faults in designs with combinational logic. The author examines three measures of testability: Overall fault-exposure distribution, high coverage, and fault grading. Sampling techniques are compared with the Stafan and Protest approximate testability measures. © 1988 IEEE