Determination of the oxygen precipitate-free zone width in silicon wafers from surface photovoltage measurements
- Terry I. Chappell
- Patrick W. Chye
- et al.
- 1983
- Solid-State Electronics
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.