Physical and electro-chemical properties of high rate ion-beam sputtered fe films
- Jerry Lo
- L. Franco
- et al.
- 1988
- IEEE Transactions on Magnetics
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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69 results for T.C. Huang
Preparation and X-ray characterization of superconducting and related Tl2Ba2CuO6 phases
- T.C. Huang
- V.Y. Lee
- et al.
- 1988
- Materials Research Bulletin
Summary Abstract: Analysis of Co-doped iron oxide thin films by grazing incidence x-ray diffraction
- Michael F. Toney
- Ting C. Huang
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Structural phase transformation in the superconducting YLa xBa2-xCu3O7 compounds
- T.C. Huang
- Y. Tokura
- et al.
- 1988
- Applied Physics Letters
Crystallography and microstructure of Tl-Ca-Ba-Cu-O superconducting oxides
- R. Beyers
- S.S.P. Parkin
- et al.
- 1988
- Applied Physics Letters
Structure and superconducting properties of tlcan-1ba2cuno2n+3 thin films with zero resistance at temperatures above 100 K
- T.C. Huang
- W.-Y. Lee
- et al.
- 1988
- Japanese Journal of Applied Physics
High Tc YBa2Cu3O7-x thin films on Si substrates by dc magnetron sputtering from a stoichiometric oxide target
- W.-Y. Lee
- J.R. Salem
- et al.
- 1988
- Applied Physics Letters
New class of high Tc structures: Intergrowth of multiple copper oxide perovskite-like layers with double sheets of BiO
- J.B. Torrance
- Y. Tokura
- et al.
- 1988
- Solid State Communications
Establishing an Instrumental Peak Profile Calibration Standard for Powder Diffraction Analyses: International Round Robin Conducted by the JCPDS-ICDD and the U.S. National Bureau of Standards
- T.G. Fawcett
- C.E. Crowder
- et al.
- 1988
- Powder Diffraction
Analysis of cobalt-doped iron oxide thin films by synchrotron radiation
- T.C. Huang
- M. Toney
- et al.
- 1987
- Thin Solid Films