Birefringence images of arbitrarily oriented dislocation lines in (111) silicon wafers
- D.A. Jenkins
- T.S. Plaskett
- et al.
- 1979
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.