Off-specular X-ray scattering studies of the morphology of thin films
- S.K. Sinha
- Y.P. Feng
- et al.
- 1996
- Physica A: Statistical Mechanics and its Applications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.