Thickness measurements of thin perfluoropolyether polymer films on silicon and amorphous-hydrogenated carbon with X-ray reflectivity, ESCA and optical ellipsometry
- Michael F. Toney
- C. Mathew Mate
- et al.
- 2000
- Journal of Colloid and Interface Science
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.