High resolution studies of NiSi2 ultrathin film formation by ion scattering and cross-section tem
- E.J. Van Loenen
- A.E.M.J. Fischer
- et al.
- 1985
- Surface Science
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.