Ultrashort electron-pulse probing of integrated circuits
- Jean-Marc Halbout
- Paul May
- et al.
- 1988
- Journal of Modern Optics
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22 results for P.G. May
Picosecond photoelectron scanning electron microscope for noncontact testing of integrated circuits
- P.G. May
- J.-M. Halbout
- et al.
- 1987
- Applied Physics Letters