Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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4 results for P. Olivo

Charge trapping and retention in ultra-thin oxide-nitride-oxide structures
- - P. Olivo
  - Z.A. Weinberg
  - et al.
- 1991
- Solid State Electronics
Oxide-Thickness Determination in Thin-Insulator MOS Structures
- - Bruno Ricco
  - Piero Olivo
  - et al.
- 1988
- IEEE T-ED
High-Field-Induced Degradation in Ultra-Thin SiO₂ Films
- - Piero Olivo
  - Thao N. Nguyen
  - et al.
- 1988
- IEEE T-ED
Evidence of the role of defects near the injecting interface in determining SiO₂ breakdown
- - P. Olivo
  - B. Ricco
  - et al.
- 1987
- Applied Physics Letters