TRIM: TESTABILITY RANGE BY IGNORING THE MEMORY.
- Larry Carter
- Leendert M. Huisman
- et al.
- 1985
- IEEE ITC 1985
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TRIM: Testability Range by Ignoring the Memory
- Larry Carter
- Leendert M. Huisman
- et al.
- 1988
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems