Magnetic-force-sensing STM: novel application of STM for simultaneous measurement of topography and field gradient of magnetic recording heads
- O. Watanuki
- F. Sai
- et al.
- 1992
- Ultramicroscopy
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.