Process variation effects on circuit performance: TCAD simulation of 256-mbit technology
- C.S. Murthy
- M. Gall
- 1997
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.