Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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6 results for A. Strong

Line edge roughness and spacing effect on low-k TDDB characteristics
- - F. Chen
  - J.R. Lloyd
  - et al.
- 2008
- IRPS 2008
Measurements of effective thermal conductivity for advanced interconnect structures with various composite low-K dielectrics
- - F. Chen
  - J. Gill
  - et al.
- 2004
- IRPS 2004
Measurements of effective thermal conductivity for advanced interconnect structures with various composite low-k dielectrics
- - F. Chen
  - J. Gill
  - et al.
- 2004
- IRPS 2004
Novel techniques for scaling deep trench DRAM capacitor technology to 0.11 μm and beyond
- - P.S. Parkinson
  - K. Settlemyer
  - et al.
- 2003
- VLSI-TSA 2003
Time-dependent dielectric breakdown evaluation of deep trench capacitor with sidewall hemispherical, polysilicon grains for gigabit DRAM technology
- - Fen Chen
  - Porshia Parkinson
  - et al.
- 2002
- IIRW 2002
Determination of the thermal conductivity of composite low-k dielectrics for advanced interconnect structures
- - F. Chen
  - J. Gill
  - et al.
- 2006
- Microelectronics Reliability