VDD scaling for FinFET logic and memory circuits: The impact of process variations and SRAM stability
- C.-H. Lin
- K. Das
- et al.
- 2006
- VLSI-TSA 2006
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.