Broken scan chain diagnostics based on time-integrated and time-dependent emission measurements
- Franco Stellari
- Peilln Song
- et al.
- 2004
- ISTFA 2004
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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3 results for Tian Xia
A novel scan chain diagnostics technique based on light emission from leakage current
- Peilin Song
- Franco Stellari
- et al.
- 2004
- IEEE ITC 2004
CMOS IC diagnostics using the light emission from off-state leakage currents (LEOSLC)
- Peilin Song
- Stas Polonsky
- et al.
- 2005
- Electronic Device Failure Analysis