Low-frequency noise of 90nm nFETs: Hot-carrier degradation and deuterium effect
- M. Erturk
- R. Anna
- et al.
- 2004
- SiRF 2004
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.