Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

Date

Start

End

Featured collections

Popular topics

5 results for Shuso Fujii

Flexible test mode design for DRAM characterization
- - H. Wong
  - T. Kirihata
  - et al.
- 1996
- VLSI Circuits 1996
Flexible test mode approach for 256-Mb DRAM
- - Toshiaki Kirihata
  - Hing Wong
  - et al.
- 1997
- IEEE Journal of Solid-State Circuits
Fault-tolerant designs for 256 Mb DRAM
- - Toshiaki Kirihata
  - Yohji Watanabe
  - et al.
- 1996
- IEEE Journal of Solid-State Circuits
A 286 mm² 256 Mb DRAM with ×32 both-ends DQ
- - Yohji Watanabe
  - Hing Wong
  - et al.
- 1996
- IEICE Transactions on Electronics
Fault-tolerant designs for 256 Mb DRAM
- - Toshiaki Kirihata
  - Yohji Watanabe
  - et al.
- 1996
- IEICE Transactions on Electronics