Fault-tolerant designs for 256 Mb DRAM
- Toshiaki Kirihata
- Yohji Watanabe
- et al.
- 1996
- IEEE Journal of Solid-State Circuits
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.