Structural study of SiOx amorphous thin films by the grazing incidence X-ray scattering (GIXS) method
- Eiichiro Matsubara
- Kunioki Kato
- et al.
- 1996
- Science Reports of the Rerearch Institutes Tohoku University Series A-Physics
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.