Ion scattering for in situ characterization of composition of La2-xSrxCuO4 films
- P.K. Hucknall
- S. Sugden
- et al.
- 1996
- Applied Physics Letters
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.