Interfacial microstructures of ultrathin Ge layers on Si probed by x-ray scattering and fluorescence yield
- Z.H. Ming
- Y.L. Soo
- et al.
- 1994
- Applied Physics Letters
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.