Study of CuOy layers on Si and MgO by a combination of ion beam analysis (RBS/NRA), X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS)
- J.C. Cheang-Wong
- C. Ortega
- et al.
- 1993
- Applied Surface Science
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.