Transport-analysis-based 3-D TCAD capacitance extraction for sub-32-nm SRAM structures
- Ajay N. Bhoj
- Rajiv V. Joshi
- 2012
- IEEE Electron Device Letters
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.