Effects of a stress field on boron ion implantation damage in silicon
- J.D. Mis
- S. Mader
- et al.
- 1993
- Journal of Applied Physics
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2 results for J.D. Mis
The microstructure, mechanical stress, texture, and electromigration behavior of Al-Pd alloys
- K.P. Rodbell
- D.B. Knorr
- et al.
- 1993
- Journal of Electronic Materials