Impact of moisture on charge trapping and flatband voltage in Al 2O3 gate dielectric films
- Sufi Zafar
- A.C. Callegari
- et al.
- 2002
- Applied Physics Letters
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.