Design methodologies for robust nano-positioning
- Abu Sebastian
- Srinivasa M. Salapaka
- 2005
- IEEE TCST
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A robust control based solution to the sample-profile estimation problem in fast atomic force microscopy
- Srinivasa M. Salapaka
- Tathagata De
- et al.
- 2005
- International Journal of Robust and Nonlinear Control
Sample-profile estimate for fast atomic force microscopy
- Srinivasa Salapaka
- Tathagata De
- et al.
- 2005
- Applied Physics Letters