Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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55 results for Miaomiao Wang

Modeling of NBTI kinetics in replacement metal gate Si and SiGe FinFETs - Part-II: AC stress and recovery
- - Narendra Parihar
  - Richard G. Southwick
  - et al.
- 2018
- IEEE T-ED
Modeling of NBTI kinetics in RMG Si and SiGe FinFETs, Part-I: DC stress and recovery
- - Narendra Parihar
  - Richard G. Southwick
  - et al.
- 2018
- IEEE T-ED
Ultrafast measurements and physical modeling of NBTI stress and recovery in RMG FinFETs under diverse DC-AC experimental conditions
- - Narendra Parihar
  - Uma Sharma
  - et al.
- 2018
- IEEE T-ED
Reliability of advanced high-k/metal-gate n-FET devices
- - J.H. Stathis
  - M. Wang
  - et al.
- 2010
- Microelectronics Reliability
Recovery study of negative bias temperature instability
- - Miaomiao Wang
  - Sufi Zafar
  - et al.
- 2009
- Microelectronic Engineering