A model for negative bias temperature instability (NBTI) in oxide and high κ pFETs
- Sufi Zafar
- Byoung H. Lee
- et al.
- 2004
- VLSI Technology 2004
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.