Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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4 results for W. McMahon

Voltage ramp stress for hot-carrier screening of scaled CMOS devices
- - A. Kerber
  - W. McMahon
  - et al.
- 2012
- IEEE Electron Device Letters
Process dependence of AC/DC PBTI in HKMG n-MOSFETs
- - Wen Liu
  - Giuseppe La Rosa
  - et al.
- 2014
- IRPS 2014
Intrinsic dielectric stack reliability of a high performance bulk planar 20nm replacement gate high-k metal gate technology and comparison to 28nm gate first high-k metal gate process
- - W. McMahon
  - C. Tian
  - et al.
- 2013
- IRPS 2013
Fast characterization of the Static Noise Margin degradation of cross-coupled inverters and correlation to BTI instabilities in MG/HK devices
- - Andreas Kerber
  - N. Pimparkar
  - et al.
- 2011
- IRPS 2011