Temperature-dependent studies of the electrical properties and the conduction mechanism of HfOx-based RRAM
- Chiyui Ahn
- Seyoung Kim
- et al.
- 2014
- VLSI-TSA 2014
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.