Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates
- Simon Gaudet
- Koen De Keyser
- et al.
- 2013
- JVSTA
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2 results for Samuel Lambert-Milot
MnP nanoclusters embedded in GaP epitaxial films grown by organometallic vapor-phase epitaxy: A reciprocal space mapping and transmission electron microscopy study
- Samuel Lambert-Milot
- Simon Gaudet
- et al.
- 2012
- JVSTA