Temperature dependent defect formation and charging in hafnium oxides and silicates
- D. Lim
- R. Haight
- 2005
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.