A Bayesian goodness of fit test and semiparametric generalization of logistic regression with measurement data
- Angela Schörgendorfer
- Adam J. Branscum
- et al.
- 2013
- Biometrics
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.